Content for TR 38.905 Word version: 17.7.0
2 References
3 Definitions, symbols and abbreviations
4 Test coverage analysis
A Derivation documents
B Principles for test point selection for NR CA reference sensitivity test cases
C Principles for test point selection for FR2 NR CA reference sensitivity test cases
D Principles for test point selection for EN-DC reference sensitivity test cases
$ Change history
2 References p. 6
3 Definitions, symbols and abbreviations p. 6
4 Test coverage analysis p. 7
4.1 Test point analysis for FR1 test cases in TS 38.521-1 p. 7
4.1.1 Test point analysis per test case p. 7
4.1.1.1 FR1 single carrier, NR CA and UL MIMO test cases p. 7
4.1.1.2 FR1 SUL test cases p. 14
4.1.1.3 FR1 V2X test cases p. 16
4.1.1.4 FR1 RedCap test cases p. 16
4.1.1.5 FR1 TxD test cases p. 16
4.1.1.6 FR1 shared spectrum channel access test cases p. 17
4.1.2 Test point analysis per NS value p. 17
4.1.2.1 A-MPR, A-SEM and A-SE FR1 test cases for single carrier and UL MIMO p. 17
4.1.2.2 A-MPR test cases for FR1 UL CA p. 20
4.1.3 Test point analysis per NR CA configuration p. 21
4.2 Test point analysis for FR2 test cases in TS 38.521-2 p. 25
4.2.2 Test point analysis per NS value p. 29
4.2.3 Test point analysis per NR CA configuration p. 29
4.3 Test point analysis for test cases in TS 38.521-3 p. 30
A Derivation documents p. 43
B Principles for test point selection for NR CA reference sensitivity test cases p. 43
B.1 General p. 43
B.2 Test case structure p. 44
B.3 Test Environment p. 45
B.4 Test Frequencies selection p. 45
B.5 Test Channel Bandwidth selection p. 45
B.6 Modulation selections p. 46
B.7 Examples p. 46
B.8 Current test completion status per CA configuration p. 47
B.9 Reference Sensitivity checklist for CA p. 47
C Principles for test point selection for FR2 NR CA reference sensitivity test cases p. 47
D Principles for test point selection for EN-DC reference sensitivity test cases p. 48
D.1 General p. 48
D.2 Requirements p. 48
D.2.1 Defined EN-DC configurations p. 48
D.2.2 Definition of exception requirements p. 49
D.2.3 Reference sensitivity p. 49
D.2.4 Rx requirements other than reference sensitivity p. 50
D.2.5 Test case structure and test coverage p. 50
D.2.6 EN-DC configurations to test p. 51
D.2.6.1 Lower order fallbacks p. 51
D.2.6.2 EN-DC configurations requiring testing and max number of CCs p. 52
D.2.6.3 Test coverage p. 52
D.2.7 Test Environment p. 56
D.2.8 Test Frequencies selections for EN-DC p. 56
D.2.9 Test EN-DC channel bandwidth p. 59
D.2.9.1 Test point selection EN-DC configuration without exception p. 59
D.2.9.2 Test point selection EN-DC configuration with exception p. 59
D.2.10 RB allocation and RB location selections p. 60
D.2.10.1 Test point selection EN-DC configuration without exception p. 60
D.2.10.2 Test point selection EN-DC configuration with exception when exception applies p. 60
D.2.10.3 Test point selection EN-DC configuration with exception when exception does not apply p. 60
D.2.11 Modulation scheme selections p. 60
D.2.12 Current test completion status per EN-DC configuration p. 61
$ Change history p. 62
