Content for TS 38.175 Word version: 16.3.0
8 Emission
8.1 Test configurations
8.2 Radiated emission
8.3 Conducted emission DC power input/output port
8.4 Conducted emissions, AC mains power input/output port
8.5 Conducted emissions, telecommunication port
8.6 Harmonic Current emissions (AC mains input port)
8.7 Voltage fluctuations and flicker (AC mains input port)
9 Immunity
9.1 Test configurations
9.2 RF electromagnetic field (80 MHz - 6000 MHz)
9.3 Electrostatic discharge
9.4 Fast transients common mode
9.5 RF common mode (0.15 MHz - 80 MHz)
9.6 Voltage dips and interruptions
9.7 Surges, common and differential mode
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8 Emission Word‑p. 17
8.1 Test configurations
8.2 Radiated emission Word‑p. 18
8.2.1 Radiated emission, IAB
8.2.1.1 Definition
8.2.1.2 Test method
8.2.1.3 Limits Word‑p. 19
8.2.1.4 Interpretation of the measurement results
8.2.2 Radiated emission, ancillary equipment Word‑p. 20
8.3 Conducted emission DC power input/output port
8.4 Conducted emissions, AC mains power input/output port
8.5 Conducted emissions, telecommunication port Word‑p. 22
8.6 Harmonic Current emissions (AC mains input port)
8.7 Voltage fluctuations and flicker (AC mains input port)
9 Immunity
9.1 Test configurations
9.2 RF electromagnetic field (80 MHz - 6000 MHz) Word‑p. 23
9.3 Electrostatic discharge
9.4 Fast transients common mode
9.5 RF common mode (0.15 MHz - 80 MHz) Word‑p. 27
9.6 Voltage dips and interruptions
9.7 Surges, common and differential mode
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