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Content for TS 38.113 Word version: 18.5.0

1… 3… 8… 9…

8.1 Test configurations 8.2 Radiated emission 8.3 Conducted emission DC power input/output port 8.4 Conducted emissions, AC mains power input/output port 8.5 Conducted emissions, telecommunication port 8.6 Harmonic current emissions (AC mains input port) 8.7 Voltage fluctuations and flicker (AC mains input port)

8 Emission p. 23

8.1 Test configurations p. 23

8.1.1 Void

8.1.2 Void

8.1.3 Void

8.1.4 Void

8.1.5 Void

8.2 Radiated emission p. 23

8.2.1 Radiated emission, BS p. 23

8.2.1.1 Definition p. 24

8.2.1.2 Test method p. 24

8.2.1.3 Limits p. 24

8.2.1.4 Interpretation of the measurement results p. 25

8.2.2 Radiated emission, ancillary equipment p. 26

8.2.2.1 Definition p. 26

8.2.2.2 Test method p. 26

8.2.2.3 Limits p. 26

8.3 Conducted emission DC power input/output port p. 27

8.3.1 Definition p. 27

8.3.2 Test method p. 27

8.3.3 Limits p. 27

8.4 Conducted emissions, AC mains power input/output port p. 27

8.4.1 Definition p. 28

8.4.2 Test method p. 28

8.4.3 Limits p. 28

8.5 Conducted emissions, telecommunication port p. 28

8.5.1 Definition p. 28

8.5.2 Test method p. 28

8.5.3 Limits p. 28

8.6 Harmonic current emissions (AC mains input port) p. 29

8.7 Voltage fluctuations and flicker (AC mains input port) p. 29