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Content for TS 38.113 Word version: 17.0.0

1… 3… 8… 9…

8.1 Test configurations 8.2 Radiated emission 8.3 Conducted emission DC power input/output port 8.4 Conducted emissions, AC mains power input/output port 8.5 Conducted emissions, telecommunication port 8.6 Harmonic current emissions (AC mains input port) 8.7 Voltage fluctuations and flicker (AC mains input port)

8 Emission Word‑p. 19

8.1 Test configurations Word‑p. 19

8.1.1 Void

8.1.2 Void

8.1.3 Void

8.1.4 Void

8.1.5 Void

8.2 Radiated emission Word‑p. 19

8.2.1 Radiated emission, BS Word‑p. 19

8.2.1.1 Definition Word‑p. 20

8.2.1.2 Test method Word‑p. 20

8.2.1.3 Limits Word‑p. 20

8.2.1.4 Interpretation of the measurement results Word‑p. 21

8.2.2 Radiated emission, ancillary equipment Word‑p. 22

8.2.2.1 Definition Word‑p. 22

8.2.2.2 Test method Word‑p. 22

8.2.2.3 Limits Word‑p. 22

8.3 Conducted emission DC power input/output port Word‑p. 22

8.3.1 Definition Word‑p. 22

8.3.2 Test method Word‑p. 23

8.3.3 Limits Word‑p. 23

8.4 Conducted emissions, AC mains power input/output port Word‑p. 23

8.4.1 Definition Word‑p. 23

8.4.2 Test method Word‑p. 23

8.4.3 Limits Word‑p. 23

8.5 Conducted emissions, telecommunication port Word‑p. 24

8.5.1 Definition Word‑p. 24

8.5.2 Test method Word‑p. 24

8.5.3 Limits Word‑p. 24

8.6 Harmonic current emissions (AC mains input port) Word‑p. 24

8.7 Voltage fluctuations and flicker (AC mains input port) Word‑p. 24