TS 38.181
5G New Radio —
Satellite Access Node Conformance Testing
V18.1.0 (PDF)
2024/03 … p.
V17.4.0
2024/03 … p.
- Rapporteur:
- Miss Guo, Qiuge
CATT
full Table of Contents for TS 38.181 Word version: 17.2.0
1 Scope
2 References
3 Definitions of terms, symbols and abbreviations
4 General test conditions and declarations
5 Operating bands and channel arrangement
6 Conducted transmitter characteristics
7 Conducted receiver characteristics
8 Conducted performance characteristics
9 Radiated transmitter characteristics
10 Radiated receiver characteristic
11 Radiated performance requirements
A Reference measurement channel
B Environmental requirements for the SAN equipment
C Test tolerances and derivation of test requirements
D Measurement system set-up
E Characteristic of interfering signal
G Propagation conditions
H In-channel Tx test
$ Change history
1 Scope p. 29
The present document specifies the Radio Frequency (RF) test methods and conformance requirements for NR Satellite Access Node (SAN) type 1-H and type 1-O. These have been derived from and are consistent with the conducted requirements for SAN type 1-H and radiated requirement for SAN type 1-H and type 1-O in NR SAN specification defined in TS 38.108.
2 References p. 29
3 Definitions of terms, symbols and abbreviations p. 30
4 General test conditions and declarations p. 35
4.1 Measurement uncertainties and test requirements p. 35
4.1.1 General p. 35
4.1.2 Acceptable uncertainty of Test System p. 36
4.1.2.1 General p. 36
4.1.2.2 Measurement of transmitter p. 37
4.1.2.3 Measurement of receiver p. 38
4.1.2.4 Measurement of performance requirements p. 40
4.1.3 Interpretation of measurement results p. 40
4.2 Requirement reference points p. 41
4.2.1 SAN type 1-H p. 41
4.2.2 SAN type 1-O p. 42
4.3 Satellite Access Node classes p. 42
4.4 Regional requirements p. 42
4.5 SAN configurations p. 43
4.5.1 SAN type 1-H transmit configurations p. 43
4.5.2 SAN type 1-H receive configurations p. 43
4.5.3 SAN type 1-O transmit configurations p. 44
4.5.4 SAN type 1-O receive configurations p. 44
4.5.5 Power supply options p. 44
4.6 Manufacturer declarations p. 45
4.7 Test configurations p. 52
4.7.1 General p. 52
4.7.2 Test signal used to build Test Configurations p. 52
4.7.3 NRTC1: Contiguous spectrum operation p. 53
4.8 Applicability of requirements p. 53
4.8.1 General p. 53
4.8.2 Requirement set applicability p. 53
4.8.3 Applicability of test configurations for single-band operation p. 54
4.9 RF channels and test models p. 55
4.9.1 RF channels p. 55
4.9.2 Test models p. 56
4.9.2.1 General p. 56
4.9.2.2 FR1 test models p. 56
4.9.2.2.1 FR1 test model 1.1 (NR-SAN-FR1-TM1.1) p. 57
4.9.2.2.2 FR1 test model 1.2 (NR-SAN-FR1-TM1.2) p. 58
4.9.2.2.3 FR1 test model 2 (NR-SAN-FR1-TM2) p. 58
4.9.2.2.4 FR1 test model 3.1 (NR-SAN-FR1-TM3.1) p. 59
4.9.2.2.5 FR1 test model 3.2 (NR-SAN-FR1-TM3.2) p. 59
4.9.2.2.6 FR1 test model 3.3 (NR-SAN-FR1-TM3.3) p. 60
4.9.2.3 Data content of Physical channels and Signals for NR-SAN-FR1-TM p. 61
4.9.2.3.1 PDCCH p. 61
4.9.2.3.2 PDSCH p. 61
4.10 Void
4.11 Reference coordinate system p. 62
4.12 Format and interpretation of tests p. 63
5 Operating bands and channel arrangement p. 64
6 Conducted transmitter characteristics p. 64
6.1 General p. 64
6.1.1 SAN type 1-H p. 64
6.2 Satellite Access Node output power p. 64
6.2.1 Definition and applicability p. 64
6.2.2 Minimum requirement p. 65
6.2.3 Test purpose p. 65
6.2.4 Method of test p. 65
6.2.4.1 Initial conditions p. 65
6.2.4.2 Procedure p. 65
6.2.5 Test requirement p. 66
6.3 Output power dynamics p. 66
6.3.1 General p. 66
6.3.2 RE power control dynamic range p. 66
6.3.2.1 Definition and applicability p. 66
6.3.2.2 Minimum requirement p. 66
6.3.2.3 Test purpose p. 66
6.3.3 Total power dynamic range p. 66
6.3.3.1 Definition and applicability p. 66
6.3.3.2 Minimum requirement p. 66
6.3.3.3 Test purpose p. 67
6.3.3.4 Method of test p. 67
6.3.3.4.1 Initial conditions p. 67
6.3.3.4.2 Procedure p. 67
6.3.3.5 Test requirements p. 67
6.4 Transmit ON/OFF power p. 68
6.5 Transmitted signal quality p. 68
6.5.1 General p. 68
6.5.2 Frequency error p. 68
6.5.2.1 Definition and applicability p. 68
6.5.2.2 Minimum Requirement p. 68
6.5.2.3 Test purpose p. 68
6.5.2.4 Method of test p. 68
6.5.2.5 Test Requirements p. 68
6.5.3 Modulation quality p. 69
6.5.3.1 Definition and applicability p. 69
6.5.3.2 Minimum Requirement p. 69
6.5.3.3 Test purpose p. 69
6.5.3.4 Method of test p. 69
6.5.3.4.1 Initial conditions p. 69
6.5.3.4.2 Procedure p. 69
6.5.3.5 Test requirements p. 70
6.6 Unwanted emissions p. 71
6.6.1 General p. 71
6.6.2 Occupied bandwidth p. 71
6.6.2.1 Definition and applicability p. 71
6.6.2.2 Minimum requirements p. 71
6.6.2.3 Test purpose p. 71
6.6.2.4 Method of test p. 72
6.6.2.4.1 Initial conditions p. 72
6.6.2.4.2 Procedure p. 72
6.6.2.5 Test requirements p. 72
6.6.3 Adjacent Channel Leakage Power Ratio (ACLR) p. 72
6.6.3.1 Definition and applicability p. 72
6.6.3.2 Minimum requirement p. 73
6.6.3.3 Test purpose p. 73
6.6.3.4 Method of test p. 73
6.6.3.4.1 Initial conditions p. 73
6.6.3.4.2 Procedure p. 73
6.6.3.5 Test requirements p. 73
6.6.3.5.1 General requirements p. 73
6.6.3.5.2 Limits p. 74
6.6.4 Out-of-band emissions p. 74
6.6.4.1 Definition and applicability p. 74
6.6.4.2 Minimum requirement p. 75
6.6.4.3 Test purpose p. 75
6.6.4.4 Method of test p. 75
6.6.4.4.1 Initial conditions p. 75
6.6.4.4.2 Procedure p. 75
6.6.4.5 Test requirements p. 76
6.6.5 Transmitter spurious emissions p. 76
6.6.5.1 Definition and applicability p. 76
6.6.5.2 Minimum requirement p. 76
6.6.5.3 Test purpose p. 76
6.6.5.4 Method of test p. 77
6.6.5.4.1 Initial conditions p. 77
6.6.5.4.2 Procedure p. 77
6.6.5.5 Test requirements p. 78
6.6.5.5.1 Basic limits p. 78
6.7 Transmitter intermodulation p. 78
7 Conducted receiver characteristics p. 78
7.1 General p. 78
7.2 Reference sensitivity level p. 79
7.2.1 Definition and applicability p. 79
7.2.2 Minimum requirement p. 79
7.2.3 Test purpose p. 79
7.2.4 Method of test p. 79
7.2.4.1 Initial conditions p. 79
7.2.4.2 Procedure p. 79
7.2.5 Test requirements p. 79
7.3 Dynamic range p. 80
7.3.1 Definition and applicability p. 80
7.3.2 Minimum requirement p. 80
7.3.3 Test purpose p. 80
7.3.4 Method of test p. 80
7.3.4.1 Initial conditions p. 80
7.3.4.2 Procedure p. 81
7.3.5 Test requirements p. 81
7.4 In-band sensitivity and blocking p. 81
7.4.1 Adjacent Channel Selectivity (ACS) p. 81
7.4.1.1 Definition and applicability p. 81
7.4.1.2 Minimum requirement p. 81
7.4.1.3 Test purpose p. 82
7.4.1.4 Method of test p. 82
7.4.1.4.1 Initial conditions p. 82
7.4.1.4.2 Procedure p. 82
7.4.1.5 Test requirements p. 82
7.4.2 In-band blocking p. 83
7.5 Out-of-band blocking p. 83
7.5.1 Definition and applicability p. 83
7.5.2 Minimum requirement p. 83
7.5.3 Test purpose p. 83
7.5.4 Method of test p. 83
7.5.4.1 Initial conditions p. 83
7.5.4.2 Procedure p. 84
7.5.5 Test requirements p. 84
7.6 Receiver spurious emission p. 84
7.7 Receiver intermodulation p. 84
7.8 In-channel selectivity p. 85
7.8.1 Definition and applicability p. 85
7.8.2 Minimum requirement p. 85
7.8.3 Test purpose p. 85
7.8.4 Method of test p. 85
7.8.4.1 Initial conditions p. 85
7.8.4.2 Procedure p. 85
7.8.5 Test requirements p. 85
8 Conducted performance characteristics p. 87
8.1 General p. 87
8.1.1 Scope and definitions p. 87
8.1.2 Applicability rule p. 87
8.1.2.1 General p. 87
8.1.2.2 Applicability of PUSCH performance requirements p. 87
8.1.2.2.1 Applicability of requirements for different subcarrier spacings p. 87
8.1.2.2.2 Applicability of requirements for different channel bandwidths p. 87
8.1.2.2.3 Applicability of requirements for different configurations p. 88
8.1.2.3 Applicability of PUCCH performance requirements p. 88
8.1.2.3.1 Applicability of requirements for different formats p. 88
8.1.2.3.2 Applicability of requirements for different subcarrier spacings p. 88
8.1.2.3.3 Applicability of requirements for different channel bandwidths p. 88
8.1.2.3.4 Applicability of requirements for different configurations p. 88
8.1.2.3.5 Applicability of requirements for multi-slot PUCCH p. 88
8.1.2.4 Applicability of PRACH performance requirements p. 88
8.2 Performance requirements for PUSCH p. 89
8.2.1 Performance requirements for PUSCH with transform precoding disabled p. 89
8.2.1.1 Definition and applicability p. 89
8.2.1.2 Minimum Requirement p. 89
8.2.1.3 Test Purpose p. 89
8.2.1.4 Method of test p. 89
8.2.1.4.1 Initial Conditions p. 89
8.2.1.4.2 Procedure p. 89
8.2.1.5 Test Requirement p. 90
8.2.2 Performance requirements for PUSCH with transform precoding enabled p. 91
8.2.2.1 Definition and applicability p. 91
8.2.2.2 Minimum Requirement p. 91
8.2.2.3 Test Purpose p. 91
8.2.2.4 Method of test p. 91
8.2.2.4.1 Initial Conditions p. 91
8.2.2.4.2 Procedure p. 91
8.2.2.5 Test Requirement p. 92
8.2.3 Performance requirements for UL timing adjustment p. 93
8.2.3.1 Definition and applicability p. 93
8.2.3.2 Minimum Requirement p. 94
8.2.3.3 Test Purpose p. 94
8.2.3.4 Method of test p. 94
8.2.3.4.1 Initial Conditions p. 94
8.2.3.4.2 Procedure p. 94
8.2.3.5 Test Requirement for Normal Mode p. 95
8.2.4 Performance requirements for PUSCH repetition Type A p. 96
8.2.4.1 Definition and applicability p. 96
8.2.4.2 Minimum Requirement p. 96
8.2.4.3 Test Purpose p. 96
8.2.4.4 Method of test p. 96
8.2.4.4.1 Initial Conditions p. 96
8.2.4.4.2 Procedure p. 96
8.2.4.5 Test Requirement p. 97
8.3 Performance requirements for PUCCH p. 98
8.3.1 Performance requirements for PUCCH format 0 p. 98
8.3.1.1 Definition and applicability p. 98
8.3.1.2 Minimum Requirement p. 98
8.3.1.3 Test purpose p. 98
8.3.1.4 Method of test p. 98
8.3.1.4.1 Initial conditions p. 98
8.3.1.4.2 Procedure p. 98
8.3.1.5 Test Requirement p. 99
8.3.2 Performance requirements for PUCCH format 1 p. 100
8.3.2.1 NACK to ACK detection p. 100
8.3.2.1.1 Definition and applicability p. 100
8.3.2.1.2 Minimum Requirement p. 100
8.3.2.1.3 Test purpose p. 100
8.3.2.1.4 Method of test p. 100
8.3.2.1.4.1 Initial Conditions p. 100
8.3.2.1.4.2 Procedure p. 100
8.3.2.1.5 Test Requirement p. 101
8.3.2.2 ACK missed detection p. 102
8.3.2.2.1 Definition and applicability p. 102
8.3.2.2.2 Minimum Requirement p. 102
8.3.2.2.3 Test purpose p. 102
8.3.2.2.4 Method of test p. 102
8.3.2.2.4.1 Initial Conditions p. 102
8.3.2.2.4.2 Procedure p. 102
8.3.2.2.5 Test Requirement p. 103
8.3.3 Performance requirements for PUCCH format 2 p. 103
8.3.3.1 ACK missed detection p. 103
8.3.3.1.1 Definition and applicability p. 103
8.3.3.1.2 Minimum requirements p. 104
8.3.3.1.3 Test purpose p. 104
8.3.3.1.4 Method of test p. 104
8.3.3.1.4.1 Initial Condition p. 104
8.3.3.1.4.2 Procedure p. 104
8.3.3.1.5 Test requirements p. 105
8.3.3.2 UCI BLER performance requirements p. 105
8.3.3.2.1 Definition and applicability p. 105
8.3.3.2.2 Minimum Requirement p. 105
8.3.3.2.3 Test purpose p. 105
8.3.3.2.4 Method of test p. 106
8.3.3.2.4.1 Initial Condition p. 106
8.3.3.2.4.2 Procedure p. 106
8.3.3.2.5 Test requirements p. 107
8.3.4 Performance requirements for PUCCH format 3 p. 107
8.3.4.1 Definition and applicability p. 107
8.3.4.2 Minimum requirement p. 107
8.3.4.3 Test purpose p. 107
8.3.4.4 Method of test p. 107
8.3.4.4.1 Initial conditions p. 107
8.3.4.4.2 Procedure p. 107
8.3.4.5 Test requirement p. 108
8.3.5 Performance requirements for PUCCH format 4 p. 109
8.3.5.1 Definition and applicability p. 109
8.3.5.2 Minimum requirement p. 109
8.3.5.3 Test purpose p. 109
8.3.5.4 Method of test p. 109
8.3.5.4.1 Initial conditions p. 109
8.3.5.4.2 Procedure p. 109
8.3.5.5 Test requirement p. 110
8.3.6 Performance requirements for multi-slot PUCCH p. 111
8.3.6.1 Performance requirements for multi-slot PUCCH format 1 p. 111
8.3.6.1.1 NACK to ACK detection p. 111
8.3.6.1.1.1 Definition and applicability p. 111
8.3.6.1.1.2 Minimum Requirement p. 111
8.3.6.1.1.3 Test purpose p. 111
8.3.6.1.1.4 Method of test p. 111
8.3.6.1.1.5 Test Requirement p. 112
8.3.6.1.2 ACK missed detection p. 112
8.3.6.1.2.1 Definition and applicability p. 112
8.3.6.1.2.2 Minimum Requirement p. 113
8.3.6.1.2.3 Test purpose p. 113
8.3.6.1.2.4 Method of test p. 113
8.3.6.1.2.5 Test Requirement p. 114
8.4 Performance requirements for PRACH p. 115
8.4.1 PRACH false alarm probability and missed detection p. 115
8.4.1.1 Definition and applicability p. 115
8.4.1.2 Minimum requirement p. 115
8.4.1.3 Test purpose p. 115
8.4.1.4 Method of test p. 115
8.4.1.4.1 Initial conditions p. 115
8.4.1.4.2 Procedure p. 115
8.4.1.5 Test requirement for Normal Mode p. 117
9 Radiated transmitter characteristics p. 118
9.1 General p. 118
9.2 Radiated transmit power p. 118
9.2.1 Definition and applicability p. 118
9.2.2 Minimum requirement p. 118
9.2.3 Test purpose p. 118
9.2.4 Method of test p. 118
9.2.4.1 Initial conditions p. 118
9.2.4.2 Procedure p. 119
9.2.5 Test requirement p. 119
9.3 OTA SAN output power p. 119
9.3.1 Definition and applicability p. 119
9.3.2 Minimum requirement p. 119
9.3.3 Test purpose p. 119
9.3.4 Method of test p. 120
9.3.4.1 Initial conditions p. 120
9.3.4.2 Procedure p. 120
9.3.5 Test requirement p. 120
9.4 OTA output power dynamics p. 120
9.4.1 General p. 120
9.4.2 OTA RE power control dynamic range p. 121
9.4.2.1 Definition and applicability p. 121
9.4.2.2 Minimum requirement p. 121
9.4.2.3 Method of test p. 121
9.4.3 OTA total power dynamic range p. 121
9.4.3.1 Definition and applicability p. 121
9.4.3.2 Minimum requirement p. 121
9.4.3.3 Test purpose p. 121
9.4.3.4 Method of test p. 121
9.4.3.4.1 Initial conditions p. 121
9.4.3.4.2 Procedure p. 122
9.4.3.5 Test requirement p. 122
9.4.3.5.1 SAN type 1-O p. 122
9.5 OTA transmit ON/OFF power p. 123
9.6 OTA transmitted signal quality p. 123
9.6.1 General p. 123
9.6.2 OTA frequency error p. 123
9.6.2.1 Definition and applicability p. 123
9.6.2.2 Minimum Requirement p. 123
9.6.2.3 Test purpose p. 123
9.6.2.4 Method of test p. 123
9.6.2.4.1 Initial conditions p. 123
9.6.2.5 Test Requirements p. 123
9.6.3 OTA modulation quality p. 123
9.6.3.1 Definition and applicability p. 123
9.6.3.2 Minimum Requirement p. 124
9.6.3.3 Test purpose p. 124
9.6.3.4 Method of test p. 124
9.6.3.4.1 Initial conditions p. 124
9.6.3.4.2 Procedure p. 124
9.6.3.5 Test requirements p. 125
9.6.3.5.1 SAN type 1-O p. 125
9.7 OTA unwanted emissions p. 126
9.7.1 General p. 126
9.7.2 OTA occupied bandwidth p. 126
9.7.2.1 General p. 126
9.7.2.2 Minimum requirement p. 127
9.7.2.3 Test purpose p. 127
9.7.2.4 Method of test p. 127
9.7.2.4.1 Initial conditions p. 127
9.7.2.4.2 Procedure p. 127
9.7.2.5 Test requirement p. 128
9.7.3 OTA Adjacent Channel Leakage Power Ratio (ACLR) p. 128
9.7.3.1 Definition and applicability p. 128
9.7.3.2 Minimum requirement p. 128
9.7.3.3 Test purpose p. 128
9.7.3.4 Method of test p. 128
9.7.3.4.1 Initial conditions p. 128
9.7.3.4.2 Procedure p. 128
9.7.3.5 Test requirements p. 129
9.7.4 OTA out-of-band emissions p. 130
9.7.4.1 Definition and applicability p. 130
9.7.4.2 Minimum requirement p. 130
9.7.4.3 Test purpose p. 130
9.7.4.4 Method of test p. 130
9.7.4.4.1 Initial conditions p. 130
9.7.4.4.2 Procedure p. 130
9.7.4.5 Test requirements p. 131
9.7.5 OTA transmitter spurious emissions p. 131
9.7.5.1 General p. 131
9.7.5.2 General OTA transmitter spurious emissions requirements p. 132
9.7.5.2.1 Definition and applicability p. 132
9.7.5.2.2 Minimum requirement p. 132
9.7.5.2.3 Test purpose p. 132
9.7.5.2.4 Method of test p. 132
9.7.5.2.4.1 Initial conditions p. 132
9.7.5.2.4.2 Procedure p. 132
9.7.5.2.5 Test requirement p. 133
9.8 OTA transmitter intermodulation p. 133
10 Radiated receiver characteristic p. 133
10.1 General p. 133
10.2 OTA sensitivity p. 134
10.2.1 Definition and applicability p. 134
10.2.2 Minimum requirement p. 135
10.2.3 Test Purpose p. 135
10.2.4 Method of test p. 135
10.2.4.1 Initial conditions p. 135
10.2.4.2 Procedure p. 135
10.2.5 Test requirements p. 136
10.3 OTA reference sensitivity level p. 136
10.3.1 Definition and applicability p. 136
10.3.2 Minimum requirement p. 136
10.3.3 Test Purpose p. 136
10.3.4 Method of test p. 137
10.3.4.1 Initial conditions p. 137
10.3.4.2 Procedure p. 137
10.3.5 Test requirements p. 137
10.3.5.1 General p. 137
10.3.5.2 Test requirements for SAN type 1-O p. 137
10.4 OTA dynamic range p. 138
10.4.1 Definition and applicability p. 138
10.4.2 Minimum requirement p. 138
10.4.3 Test purpose p. 138
10.4.4 Method of test p. 139
10.4.4.1 Initial conditions p. 139
10.4.4.2 Procedure p. 139
10.4.5 Test requirement p. 139
10.4.5.1 General p. 139
10.4.5.2 Test requirements for SAN type 1-O p. 139
10.5 OTA in-band selectivity and blocking p. 140
10.5.1 OTA adjacent channel selectivity p. 140
10.5.1.1 Definition and applicability p. 140
10.5.1.2 Minimum requirement p. 140
10.5.1.3 Test purpose p. 140
10.5.1.4 Method of test p. 140
10.5.1.4.1 Initial conditions p. 140
10.5.1.4.2 Procedure p. 141
10.5.1.5 Test requirement p. 141
10.5.2 OTA in-band blocking p. 142
10.6 OTA out-of-band blocking p. 142
10.6.1 Definition and applicability p. 142
10.6.2 Minimum requirement p. 142
10.6.3 Test purpose p. 142
10.6.4 Method of test p. 142
10.6.4.1 Initial conditions p. 142
10.6.4.2 Procedure p. 143
10.6.5 Test requirements p. 143
10.7 OTA receiver spurious emissions p. 144
10.8 OTA receiver intermodulation p. 144
10.9 OTA in-channel selectivity p. 144
10.9.1 Definition and applicability p. 144
10.9.2 Minimum requirement p. 144
10.9.3 Test purpose p. 144
10.9.4 Method of test p. 144
10.9.4.1 Initial conditions p. 144
10.9.4.2 Procedure p. 145
10.9.5 Test requirement p. 145
10.9.5.1 SAN type 1-O p. 145
11 Radiated performance requirements p. 146
11.1 General p. 146
11.1.1 Scope and definitions p. 146
11.1.2 OTA demodulation branches p. 147
11.1.3 Applicability rule p. 147
11.1.3.1 General p. 147
11.1.3.2 Applicability of PUSCH performance requirements p. 147
11.1.3.2.1 Applicability of requirements for different subcarrier spacings p. 147
11.1.3.2.2 Applicability of requirements for different channel bandwidths p. 148
11.1.3.2.3 Applicability of requirements for different configurations p. 148
11.1.3.3 Applicability of PUCCH performance requirements p. 148
11.1.3.3.1 Applicability of requirements for different formats p. 148
11.1.3.3.2 Applicability of requirements for different subcarrier spacings p. 148
11.1.3.3.3 Applicability of requirements for different channel bandwidths p. 148
11.1.3.3.4 Applicability of requirements for different configurations p. 148
11.1.3.3.5 Applicability of requirements for multi-slot PUCCH p. 148
11.1.3.4 Applicability of PRACH performance requirements p. 149
11.2 OTA performance requirements for PUSCH p. 149
11.2.1 Performance requirements for PUSCH with transform precoding disabled p. 149
11.2.1.1 Definition and applicability p. 149
11.2.1.2 Minimum Requirement p. 149
11.2.1.3 Test Purpose p. 149
11.2.1.4 Method of test p. 149
11.2.1.4.1 Initial Conditions p. 149
11.2.1.4.2 Procedure p. 149
11.2.1.5 Test Requirement p. 150
11.2.2 Performance requirements for PUSCH with transform precoding enabled p. 152
11.2.2.1 Definition and applicability p. 152
11.2.2.2 Minimum Requirement p. 152
11.2.2.3 Test Purpose p. 152
11.2.2.4 Method of test p. 152
11.2.2.4.1 Initial Conditions p. 152
11.2.2.4.2 Procedure p. 152
11.2.2.5 Test Requirement p. 153
11.2.3 Performance requirements for UL timing adjustment p. 155
11.2.3.1 Definition and applicability p. 155
11.2.3.2 Minimum Requirement p. 155
11.2.3.3 Test Purpose p. 155
11.2.3.4 Method of test p. 155
11.2.3.4.1 Initial Conditions p. 155
11.2.3.4.2 Procedure p. 155
11.2.3.5 Test Requirement p. 156
11.2.4 Performance requirements for PUSCH repetition Type A p. 157
11.2.4.1 Definition and applicability p. 157
11.2.4.2 Minimum Requirement p. 158
11.2.4.3 Test Purpose p. 158
11.2.4.4 Method of test p. 158
11.2.4.4.1 Initial Conditions p. 158
11.2.4.4.2 Procedure p. 158
11.2.4.5 Test Requirement p. 159
11.3 OTA performance requirements for PUCCH p. 160
11.3.1 Performance requirements for PUCCH format 0 p. 160
11.3.1.1 Definition and applicability p. 160
11.3.1.2 Minimum Requirement p. 160
11.3.1.3 Test purpose p. 160
11.3.1.4 Method of test p. 161
11.3.1.4.1 Initial conditions p. 161
11.3.1.4.2 Procedure p. 161
11.3.1.5 Test Requirement p. 162
11.3.2 Performance requirements for PUCCH format 1 p. 162
11.3.2.1 NACK to ACK detection p. 162
11.3.2.1.1 Definition and applicability p. 162
11.3.2.1.2 Minimum Requirement p. 162
11.3.2.1.3 Test purpose p. 163
11.3.2.1.4 Method of test p. 163
11.3.2.1.4.1 Initial Conditions p. 163
11.3.2.1.4.2 Procedure p. 163
11.3.2.1.5 Test Requirement p. 164
11.3.2.2 ACK missed detection p. 164
11.3.2.2.1 Definition and applicability p. 164
11.3.2.2.2 Minimum Requirement p. 165
11.3.2.2.3 Test purpose p. 165
11.3.2.2.4 Method of test p. 165
11.3.2.2.4.1 Initial Conditions p. 165
11.3.2.2.4.2 Procedure p. 165
11.3.2.2.5 Test Requirement p. 166
11.3.3 Performance requirements for PUCCH format 2 p. 166
11.3.3.1 ACK missed detection performance requirements p. 166
11.3.3.1.1 Definition and applicability p. 166
11.3.3.1.2 Minimum Requirement p. 167
11.3.3.1.3 Test Purpose p. 167
11.3.3.1.4 Method of test p. 167
11.3.3.1.4.1 Initial conditions p. 167
11.3.3.1.4.2 Procedure p. 167
11.3.3.1.5 Test requirement p. 168
11.3.3.2 UCI BLER performance requirements p. 168
11.3.3.2.1 Definition and applicability p. 168
11.3.3.2.2 Minimum Requirement p. 168
11.3.3.2.3 Test Purpose p. 169
11.3.3.2.4 Method of test p. 169
11.3.3.2.4.1 Initial conditions p. 169
11.3.3.2.4.2 Procedure p. 169
11.3.3.2.5 Test requirement p. 170
11.3.4 Performance requirements for PUCCH format 3 p. 170
11.3.4.1 Definition and applicability p. 170
11.3.4.2 Minimum requirement p. 170
11.3.4.3 Test purpose p. 170
11.3.4.4 Method of test p. 170
11.3.4.4.1 Initial conditions p. 170
11.3.4.4.2 Procedure p. 171
11.3.4.5 Test requirement p. 172
11.3.5 Performance requirements for PUCCH format 4 p. 172
11.3.5.1 Definition and applicability p. 172
11.3.5.2 Minimum requirement p. 172
11.3.5.3 Test purpose p. 172
11.3.5.4 Method of test p. 172
11.3.5.4.1 Initial conditions p. 172
11.3.5.4.2 Procedure p. 173
11.3.5.5 Test requirement p. 173
11.3.6 Performance requirements for multi-slot PUCCH format p. 174
11.3.6.1 Performance requirements for multi-slot PUCCH format 1 p. 174
11.3.6.1.1 NACK to ACK detection p. 174
11.3.6.1.1.1 Definition and applicability p. 174
11.3.6.1.1.2 Minimum Requirement p. 174
11.3.6.1.1.3 Test purpose p. 174
11.3.6.1.1.4 Method of test p. 174
11.3.6.1.1.5 Test Requirement p. 175
11.3.6.1.2 ACK missed detection p. 176
11.3.6.1.2.1 Definition and applicability p. 176
11.3.6.1.2.2 Minimum Requirement p. 176
11.3.6.1.2.3 Test purpose p. 176
11.3.6.1.2.4 Method of test p. 176
11.3.6.1.2.5 Test Requirement p. 177
11.4 OTA performance requirements for PRACH p. 178
11.4.1 PRACH false alarm probability and missed detection p. 178
11.4.1.1 Definition and applicability p. 178
11.4.1.2 Minimum requirement p. 178
11.4.1.3 Test purpose p. 179
11.4.1.4 Method of test p. 179
11.4.1.4.1 Initial conditions p. 179
11.4.1.4.2 Procedure p. 179
11.4.1.5 Test requirement p. 180
A (Normative) Reference measurement channel p. 181
A.1 Fixed Reference Channels for RF Rx requirement (QPSK, R=1/3) p. 181
A.2 Fixed Reference Channels for dynamic range (16QAM, R=2/3) p. 182
A.3 Fixed Reference Channels for performance requirements (QPSK, R=308/1024) p. 183
A.4 PRACH test preambles p. 185
B Environmental requirements for the SAN equipment p. 185
B.1 General p. 185
B.2 Normal test environment p. 185
B.2.1 Normal test environment for SPRF p. 185
B.2.2 Normal test environment for SAN terrestrial equipment p. 186
B.3 Extreme test environment p. 186
B.3.1 Extreme test environment for SPRF p. 186
B.3.2 Extreme test environment for SAN terrestrial equipment p. 186
B.3.3 Extreme temperature p. 187
B.3.4 Extreme power supply p. 187
B.4 Vibration p. 187
B.5 Measurement of test environment p. 188
C Test tolerances and derivation of test requirements p. 188
C.1 Measurement of transmitter p. 189
C.2 Measurement of receiver p. 190
C.3 Measurement of performance requirements p. 191
D Measurement system set-up p. 192
D.1 SAN type 1-H transmitter p. 192
D.1.1 SAN output power, output power dynamics, frequency error, EVM, unwanted emissions for SAN type 1-H p. 192
D.1.2 Transmitter intermodulation for SAN type 1-H p. 193
D.1.3 Transmitter spurious emissions for SAN type 1-H p. 193
D.1.4 Time alignment error for SAN type 1-H p. 194
D.2 SAN type 1-H receiver p. 195
D.2.1 Reference sensitivity level for SAN type 1-H p. 195
D.2.2 Receiver dynamic range for SAN type 1-H p. 195
D.2.3 Receiver adjacent channel selectivity and narrowband blocking for SAN type 1-H p. 196
D.2.4 Receiver spurious emissions p. 196
D.2.5 Receiver In-channel selectivity for SAN type 1-H p. 196
D.2.6 Receiver intermodulation for SAN type 1-H p. 196
D.3 SAN type 1-H and type 1-O transmitter p. 197
D.4 SAN type 1-H and type 1-O receiver p. 197
D.4.1 OTA sensitivity and OTA reference sensitivity level p. 198
D.4.2 OTA dynamic range, OTA adjacent channel selectivity p. 198
D.4.3 OTA out-of-band blocking p. 199
D.5 Void
D.6 SAN type 1-H performance requirements p. 200
D.6.1 Performance requirements for PUSCH, single user PUCCH, PRACH on single antenna port in multipath fading conditions p. 200
D.6.2 Performance requirements for PUSCH and PRACH in static conditions p. 201
D.6.3 Performance requirements for UL timing adjustment p. 202
D.7 SAN type 1-O performance requirements p. 202
E (Normative) Characteristic of interfering signal p. 203
F (Normative) Void
G (Normative) Propagation conditions p. 204
G.1 Static propagation condition p. 204
G.2 Multi-path fading propagation conditions p. 204
G.2.1 Delay profiles p. 204
G.2.2 Combinations of channel model parameters p. 205
G.2.3 MIMO channel correlation matrices p. 205
G.3 Moving propagation conditions p. 207
H (Normative) In-channel Tx test p. 208
H.1 General p. 208
H.2 Basic principles p. 208
H.2.1 Output signal of the TX under test p. 208
H.2.2 Ideal signal p. 209
H.2.3 Measurement results p. 209
H.2.4 Measurement points p. 209
H.3 Pre-FFT minimization process p. 210
H.4 Timing of the FFT window p. 211
H.5 Resource element TX power p. 212
H.6 Post-FFT equalisation p. 212
H.7 EVM p. 213
H.7.0 General p. 213
H.7.1 Averaged EVM (FDD) p. 214
$ Change history p. 215
