Content for TS 38.101-1 Word version: 17.6.0
A Measurement channels
A.1 General
A.2 UL reference measurement channels
A.3 DL reference measurement channels
A.4 CSI reference measurement channels
A.5 OFDMA Channel Noise Generator (OCNG)
A.7 V2X reference measurement channels
C Downlink physical channels
C.1 General
C.2 Setup
C.3 Connection
D Characteristics of the interfering signal
D.1 General
D.2 Interference signals
E Environmental conditions
E.1 General
E.2 Environmental
F Transmit modulation
F.0 General
F.1 Measurement Point
F.2 Basic Error Vector Magnitude measurement
F.3 Basic in-band emissions measurement
F.4 Modified signal under test
F.5 Window length
F.6 Averaged EVM
F.7 Spectrum Flatness
F.8 EVM measurement for dual Tx
F.9 Phase offset measurement for DMRS bundling
G Difference of relative phase and power errors
G.0 General
G.1 Measurement Point
G.2 Relative Phase Error Measurement
L ModifiedMPR-Behavior
L.1 Indication of modified MPR behavior
$ Change history
A (Normative) Measurement channels p. 626
A.1 General p. 626
A.2 UL reference measurement channels p. 626
A.2.1 General p. 626
A.2.2 Reference measurement channels p. 627
A.2.2.1 DFT-s-OFDM Pi/2-BPSK p. 627
A.2.2.2 DFT-s-OFDM QPSK p. 628
A.2.2.3 DFT-s-OFDM 16QAM p. 628
A.2.2.4 DFT-s-OFDM 64QAM p. 630
A.2.2.5 DFT-s-OFDM 256QAM p. 632
A.2.2.6 CP-OFDM QPSK p. 634
A.2.2.7 CP-OFDM 16QAM p. 636
A.2.2.8 CP-OFDM 64QAM p. 638
A.2.2.9 CP-OFDM 256QAM p. 640
A.2.3 Reference measurement channels for TDD p. 642
A.2.3.1 DFT-s-OFDM Pi/2-BPSK p. 642
A.2.3.2 DFT-s-OFDM QPSK p. 642
A.2.3.3 DFT-s-OFDM 16QAM p. 642
A.2.3.4 DFT-s-OFDM 64QAM p. 642
A.2.3.5 DFT-s-OFDM 256QAM p. 643
A.2.3.6 CP-OFDM QPSK p. 643
A.2.3.7 CP-OFDM 16QAM p. 643
A.2.3.8 CP-OFDM 64QAM p. 643
A.2.3.9 CP-OFDM 256QAM p. 643
A.3 DL reference measurement channels p. 645
A.3.1 General p. 645
A.3.2 DL reference measurement channels for FDD p. 646
A.3.2.1 General p. 646
A.3.2.2 FRC for receiver requirements for QPSK p. 646
A.3.2.3 FRC for maximum input level for 64QAM p. 649
A.3.2.4 FRC for maximum input level for 256 QAM p. 652
A.3.2.5 FRC for maximum input level for 1024 QAM |R17| p. 655
A.3.3 DL reference measurement channels for TDD p. 658
A.4 CSI reference measurement channels p. 671
A.5 OFDMA Channel Noise Generator (OCNG) p. 671
A.5.1 OCNG Patterns for FDD p. 671
A.5.2 OCNG Patterns for TDD p. 671
A.6 Void
A.7 V2X reference measurement channels |R16| p. 672
B Void
C Downlink physical channels p. 678
D (Normative) Characteristics of the interfering signal p. 680
D.1 General p. 680
D.2 Interference signals p. 680
E (Normative) Environmental conditions p. 681
E.1 General p. 681
E.2 Environmental p. 681
F (Normative) Transmit modulation p. 683
F.0 General p. 683
F.1 Measurement Point p. 683
F.2 Basic Error Vector Magnitude measurement p. 683
F.3 Basic in-band emissions measurement p. 684
F.4 Modified signal under test p. 684
F.5 Window length p. 687
F.5.1 Timing offset p. 687
F.5.2 Window length p. 687
F.5.3 Window length for normal CP p. 687
F.5.4 Window length for Extended CP p. 688
F.5.5 Window length for PRACH p. 689
F.6 Averaged EVM p. 690
F.7 Spectrum Flatness p. 691
F.8 EVM measurement for dual Tx |R17| p. 691
F.9 Phase offset measurement for DMRS bundling |R17| p. 691
G (Normative) Difference of relative phase and power errors p. 693
H Void
I Void
J Void
K Void
L (Normative) ModifiedMPR-Behavior |R16| p. 695
$ Change history p. 699
