Content for TR 37.941 Word version: 16.2.0
10 RX directional requirements
10.1 General
10.2 OTA sensitivity
10.3 OTA reference sensitivity
10.4 OTA dynamic range
10.5 OTA adjacent channel selectivity, general blocking and narrowband blocking
10.6 OTA receiver intermodulation
10.7 OTA in-channel selectivity
11 In-band TRP requirements
11.1 General
11.2 OTA BS output power
11.3 OTA ACLR
11.4 OTA SEM and OTA OBUE
10 RX directional requirements
10.1 General
10.2 OTA sensitivity Word‑p. 152
10.2.1 General
10.2.2 Indoor Anechoic Chamber
10.2.2.1 Measurement system description
10.2.2.2 Test procedure
10.2.2.3 MU value derivation, FR1
10.2.2.4 MU value derivation, FR2 Word‑p. 155
10.2.3 Compact Antenna Test Range Word‑p. 158
10.2.3.1 Measurement system description
10.2.3.2 Test procedure
10.2.3.3 MU value derivation, FR1
10.2.3.4 MU value derivation, FR2 Word‑p. 159
10.2.4 One Dimensional Compact Range Word‑p. 160
10.2.4.1 Measurement system description
10.2.4.2 Test procedure
10.2.4.3 MU value derivation, FR1 Word‑p. 161
10.2.5 Near Field Test range Word‑p. 163
10.2.5.1 Measurement system description
10.2.5.2 Test procedure
10.2.5.3 MU value derivation, FR1 Word‑p. 164
10.2.6 Plane Wave Synthesizer Word‑p. 167
10.2.7 Maximum accepted test system uncertainty Word‑p. 169
10.2.8 Test Tolerance for OTA sensitivity
10.3 OTA reference sensitivity Word‑p. 170
10.4 OTA dynamic range
10.4.1 General
10.4.2 Indoor Anechoic Chamber
10.4.2.1 Measurement system description
10.4.2.2 Test procedure
10.4.2.3 MU value derivation, FR1 Word‑p. 171
10.4.3 Compact Antenna Test Range
10.4.3A Plane Wave Synthesizer
10.4.4 Maximum accepted test system uncertainty
10.4.5 Test Tolerance for OTA dynamic range
10.5 OTA adjacent channel selectivity, general blocking and narrowband blocking
10.5.1 General
10.5.2 Indoor Anechoic Chamber Word‑p. 173
10.5.3 Compact Antenna Test Range Word‑p. 174
10.5.3A Plane Wave Synthesizer Word‑p. 176
10.5.3A.1 Measurement system description
10.5.3A.2 Test procedure
10.5.3A.3 MU value derivation, FR1 Word‑p. 177
10.5.4 Maximum accepted test system uncertainty
10.5.5 Test Tolerance for OTA ACS, general blocking and narrowband blocking Word‑p. 179
10.6 OTA receiver intermodulation
10.6.1 General
10.6.2 Indoor Anechoic Chamber
10.6.2.1 Measurement system description
10.6.2.2 Test procedure
10.6.2.3 MU value derivation, FR1 Word‑p. 180
10.6.3 Compact Antenna Test Range Word‑p. 181
10.6.3.1 Measurement system description
10.6.3.2 Test procedure
10.6.3.3 MU value derivation, FR1 Word‑p. 182
10.6.3A Plan Wave Synthesizer Word‑p. 183
10.6.3A.1 Measurement system description
10.6.3A.2 Test procedure
10.6.3A.3 MU value derivation, FR1 Word‑p. 184
10.6.4 Maximum accepted test system uncertainty Word‑p. 185
10.6.5 Test Tolerance for OTA RX IMD Word‑p. 186
10.7 OTA in-channel selectivity
10.7.1 General
10.7.2 Indoor Anechoic Chamber Word‑p. 187
10.7.3 Compact Antenna Test Range
10.7.3.1 Measurement system description
10.7.3.2 Test procedure
10.7.3.3 MU value derivation, FR1 Word‑p. 188
10.7.3A Plane Wave Synthesizer
10.7.3A.1 Measurement system description
10.7.3A.2 Test procedure
10.7.3A.3 MU value derivation, FR1
10.7.4 Maximum accepted test system uncertainty
10.7.5 Test Tolerance for OTA ICS
11 In-band TRP requirements Word‑p. 189
11.1 General
11.2 OTA BS output power
11.2.1 General
11.2.2 Indoor Anechoic Chamber
11.2.2.1 Measurement system description
11.2.2.2 Test procedure
11.2.2.3 MU value derivation, FR1 Word‑p. 190
11.2.3 Compact Antenna Test Range Word‑p. 191
11.2.3.1 Measurement system description
11.2.3.2 Test procedure
11.2.3.3 MU value derivation, FR1
11.2.3.4 MU value derivation, FR2 Word‑p. 193
11.2.4 Near Field Test Range Word‑p. 194
11.2.5 Reverberation Chamber Word‑p. 197
11.2.5.1 Measurement system description
11.2.5.2 Test procedure
11.2.5.3 MU value derivation, FR1 Word‑p. 198
11.2.5.4 MU value derivation, FR2
11.2.6 Plane Wave Synthesizer Word‑p. 199
11.2.6.1 Measurement system description
11.2.6.2 Test procedure
11.2.6.3 MU value derivation, FR1 Word‑p. 200
11.2.7 Maximum accepted test system uncertainty Word‑p. 202
11.2.8 Test Tolerance for OTA BS output power
11.3 OTA ACLR Word‑p. 203
11.3.1 General
11.3.2 Indoor Anechoic Chamber
11.3.2.1 Measurement system description
11.3.2.2 Test procedure
11.3.2.3 MU value derivation, FR1 Word‑p. 204
11.3.3 Compact Antenna Test Range Word‑p. 207
11.3.3.1 Measurement system description
11.3.3.2 Test procedure
11.3.3.3 MU value derivation, FR1
11.3.3.4 MU value derivation, FR2 Word‑p. 209
11.3.4 Near Field Test Range Word‑p. 211
11.3.4.1 Measurement system description
11.3.4.2 Test procedure
11.3.4.3 MU value derivation, FR1 Word‑p. 212
11.3.5 Reverberation Chamber Word‑p. 214
11.3.5.1 Measurement system description
11.3.5.2 Test procedure
11.3.5.3 MU value derivation, FR1
11.3.5.4 MU value derivation, FR2 Word‑p. 215
11.3.6 Plane Wave Synthesizer Word‑p. 217
11.3.6.1 Measurement system description
11.3.6.2 Test procedure
11.3.6.3 MU value derivation, FR1 Word‑p. 218
11.3.7 Maximum accepted test system uncertainty Word‑p. 221
11.3.8 Test Tolerance for OTA ACLR Word‑p. 222
11.4 OTA SEM and OTA OBUE Word‑p. 223
11.4.1 General
11.4.2 Indoor Anechoic Chamber
11.4.3 Compact Antenna Test Range Word‑p. 226
11.4.3.1 Measurement system description
11.4.3.2 Test procedure
11.4.3.3 MU value derivation, FR1
11.4.3.4 MU value derivation, FR2 Word‑p. 227
11.4.4 Near Field Test Range Word‑p. 229
11.4.5 Reverberation Chamber
11.4.5.1 Measurement system description
11.4.5.2 Test procedure
11.4.5.3 MU value derivation, FR1
11.4.5.4 MU value derivation, FR2 Word‑p. 230
11.4.6 Plane Wave Synthesizer Word‑p. 231
11.4.6.1 Measurement system description
11.4.6.2 Test procedure
11.4.6.3 MU value derivation, FR1 Word‑p. 232
11.4.7 Maximum accepted test system uncertainty
11.4.8 Test Tolerance for OTA OBUE and OTA SEM
