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Content for  TS 25.142  Word version:  16.0.0

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3  Definitions, symbols, and abbreviationsWord‑p. 19

4  Frequency bands and channel arrangementWord‑p. 22

5  General test conditions and declarationsWord‑p. 24

5.1  Base station classes

5.2  Output powerWord‑p. 25

5.3  Specified frequency range and supported channel bandwidth

5.4  Relationship between RF generation and chip clock

5.5  Spectrum emission mask

5.6  Adjacent Channel Leakage power Ratio (ACLR)

5.7  Tx spurious emissionsWord‑p. 27

5.8  Blocking characteristics

5.9  Test environments

5.10  Acceptable uncertainty of Test SystemWord‑p. 30

5.11  Test Tolerances (informative)

5.12  Interpretation of measurement results

5.13  Selection of configurations for testing

5.14  BS ConfigurationsWord‑p. 40

5.15  Overview of the conformance test requirements

5.16  Format and interpretation of testsWord‑p. 44

5.17  Regional requirements

5.18  Definition of Additive White Gaussian Noise (AWGN) InterfererWord‑p. 45

5.19  Applicability of requirements |R9|

5.20  Test configurations for multi-carrier operation |R11|Word‑p. 46

5.21  Applicability of test configurations |R11|

5.22  Requirements for BS capable of multi-band operation |R11|Word‑p. 49


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